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Leading Edge Japanese CleanTech Innovations Showcase in Boston 2010

 

Tuesday,
March 9, 2010

Metro Meeting Center
Boston
101 FEDERAL STREET, 4F
Boston, MA 02110
>>Map

Registration is Free!

Register Online
(Seat is limited!)

or
Contact: Nadia Liss
TEL: 215-701-6349

Program:

9:00am
Registration

9:30am - 10:30am
1st Session

10:30am - 10:45am
Networking Coffee Break

10:45am - 11:45pm
2nd Session

11:45am - 1:00pm
Networking Luncheon
Poster Presentation

Presented by:


Tokyo University of Science

Supporters:

http://www.techconnect.org/
TechConnect

JETRO NY: http://www.jetro.org/
JETRO New York

http://www.boston.us.emb-japan.go.jp/index.html
Consulate-General of Japan
in Boston

Keisen Associates http://www.keisenassociates.com/
Keisen Associates

Organized by:


Japan Technology Group

Click on the logo
for further details

 

 

 

Electrical Performance Failure in Photovoltaic Module by Inspection to its I-V characteristics in Darkness

This method has an advantage to analyze the variation of electrical condition correctly and periodically without suspending the system generation. This contribute to improve the system reliance of system life time so as to be evaluated the value highly.

Applied area, applied technology: Industrial Photovoltaic Power System, System Integrator

With the spreads of photovoltaic (PV) power systems in a large scale, some fault or failure are going to be reported gradually. PV power systems should be measured in fine weather periodically and inspected from the whole data to maintain the initial performance for many years. This method has a defect to suspend the generation system in fine weather to collect I-V output characterization data. Furthermore, it is difficult to separate each constituent effect precisely, since they include many factors. To diagnosis the electrical portion performance of PV array requires to measure its I-V characterization, whether it might contains slight fault of PV module. This study aims to diagnose the electrical state variation of PV modules to inspect on I-V characterization of PV array in darkness at night periodically and detect the module electrical fault or failure include bypass diode in early stage. This contributes to improve the system reliance and raises the output amount of lifetime.

Dr. Youichi Hirata, Associate Professor
Department of Electronic System Engineering, Faculty of System Engineering,
Tokyo University of Science

  • 1996: Assistant of Tokyo University of Science, Suwa College
  • 2002: Lecturer of Tokyo University of Science, Suwa, Faculty of System Engineering, Department of Electronic System Engineering
  • 2007: Associate Professor of Same University Engaged in Photovoltaic Power System and Combined System

Click here to register  *Seat is limited.

For more information about the showcase, please contact Nadia Liss at
215-701-6349 or
info@japantechnologygroup.com .


Japan Technology Group, Inc.
Eight Penn Center #1300, 1628 John F. Kennedy Blvd, Philadelphia, PA 19103
Tel: 215.701.6349 | Fax: 215.751.0192 | info@japantechnologygroup.com

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