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Leading Edge Japanese CleanTech Innovations Showcase in Boston 2010

 

Tuesday,
March 9, 2010

Metro Meeting Center
Boston
101 FEDERAL STREET, 4F
Boston, MA 02110
>>Map

Registration is Free!

Register Online
(Seat is limited!)

or
Contact: Nadia Liss
TEL: 215-701-6349

Program:

9:00am
Registration

9:30am - 10:30am
1st Session

10:30am - 10:45am
Networking Coffee Break

10:45am - 11:45pm
2nd Session

11:45am - 1:00pm
Networking Luncheon
Poster Presentation

Presented by:


Tokyo University of Science

Supporters:

http://www.techconnect.org/
TechConnect

JETRO NY: http://www.jetro.org/
JETRO New York

http://www.boston.us.emb-japan.go.jp/index.html
Consulate-General of Japan
in Boston

Keisen Associates http://www.keisenassociates.com/
Keisen Associates

Organized by:


Japan Technology Group

Click on the logo
for further details

 

 

 

Nanoimprint Mold Fabrication Process and High Durability Release Agent

Nanoimprint lithography (NIL): Our technique is novel and challenging technology, so variety applications are expected. Thermostable silane couping agent for nanoimprinting: This is the novel and high durability and high thermosatble release agent for NIL. In particular, this release agent can use for electroplating nickel mold.

Applied technology:

Nanoimprint: Optical devices, Plasmon devices, Bio devices, Printed electronics,
Anti-reflection structure: FPD (Flat Panel Display) film, Mobile phone display film
Thermostable silane couping agent for nanoimprinting: Release agent for NIL

Nanoimprint lithography (NIL) is a powerful tool for nano-scale fabrication. This process is nano-scale pattern transfer technique using nano-patterned mold. The key issues of NIL are mold fabrication process and release agent. We have been developed three-dimensional (3D) NIL mold fabrication process and high durability release agent. Sub- 100 nm 3D mold and roll shape mold are fabricated by special electron beam lithography technique. Anti-reflection structure (Moth-eye structure) mold is fabricated by ion beam bombardment. This process is rapid and can fabricate large area mold. Fabricated anti-reflection structure has less than 0.1% reflectivity at visible wave length. The surface roughness of this structure is very high, thus anchor effect prevents release. In order to release this kind mold, novel fluorinate silane coupling agent has been developed for NIL release agent. Using this release agent, high aspect ratio anti-reflection structure can be transferred by NIL. This kind high aspect ratio structure is useful for optical devices, bio-devices (scaffold for cell culture) and so on.

Dr. Jun Taniguchi, Associate Professor
Department of Electrical Engineering, Faculty of Industrial Science and Technology,
Tokyo University of Science

He received the BE, ME and PhD degrees from Tokyo University of Science, in 1994, 1996 and 1999, respectively. From 1999 to 2009, he was with Faculty of Industrial Science and Technology, Tokyo University of Science, Chiba, Japan. His research interest includes electron beam lithography, nanoimprint lithography, and nanotecnology.


Click here to register  *Seat is limited.

For more information about the showcase, please contact Nadia Liss at
215-701-6349 or
info@japantechnologygroup.com .


Japan Technology Group, Inc.
Eight Penn Center #1300, 1628 John F. Kennedy Blvd, Philadelphia, PA 19103
Tel: 215.701.6349 | Fax: 215.751.0192 | info@japantechnologygroup.com

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